59313 | SN54ABT657AJT | OCTAL TRANSCEIVERS WITH PARITY GENERATORS/CHECKERS AND 3-STATE OUTPUTS |
59314 | SN54ABT7819 | 512 x 18 x 2 Synchronous Bidirectional FIFO Memory |
59315 | SN54ABT7819GB | 512 18 2 CLOCKED BIDIRECTIONAL FIRST-IN/ FIRST-OUT MEMORY |
59316 | SN54ABT7819HT | 512 18 2 CLOCKED BIDIRECTIONAL FIRST-IN/ FIRST-OUT MEMORY |
59317 | SN54ABT7820 | 512 x 18 x 2 bidirectional asynchronous FIFO memory |
59318 | SN54ABT7820GB | 512 18 2 STROBED BIDIRECTIONAL FIRST-IN/ FIRST-OUT MEMORY |
59319 | SN54ABT821 | 10-Bit Bus Interface Flip-Flops With 3-State Outputs |
59320 | SN54ABT821FK | 10-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS |
59321 | SN54ABT821JT | 10-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS |
59322 | SN54ABT821W | 10-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS |
59323 | SN54ABT823 | 9-Bit Bus-Interface Flip-Flops With 3-State Outputs |
59324 | SN54ABT823FK | 9-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS |
59325 | SN54ABT823JT | 9-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS |
59326 | SN54ABT823W | 9-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS |
59327 | SN54ABT8245 | Scan Test Devices With Octal Bus Transceivers |
59328 | SN54ABT8245FK | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
59329 | SN54ABT8245JT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
59330 | SN54ABT827 | 10-Bit Buffers/Drivers With 3-State Outputs |
59331 | SN54ABT827FK | 10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
59332 | SN54ABT827JT | 10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
59333 | SN54ABT833 | 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS |
59334 | SN54ABT833FK | 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS |
59335 | SN54ABT833JT | 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS |
59336 | SN54ABT841 | 10-Bit Bus-Interface D-type Latches With 3-State Outputs |
59337 | SN54ABT841FK | 10-BIT BUS-INTERFACE D-TYPE LATCHES WITH 3-STATE OUTPUTS |
59338 | SN54ABT841JT | 10-BIT BUS-INTERFACE D-TYPE LATCHES WITH 3-STATE OUTPUTS |
59339 | SN54ABT841W | 10-BIT BUS-INTERFACE D-TYPE LATCHES WITH 3-STATE OUTPUTS |
59340 | SN54ABT843 | 9-Bit Bus-Interface D-type Latches With 3-State Outputs |
59341 | SN54ABT843FK | 9-BIT BUS-INTERFACE D-TYPE LATCHES WITH 3-STATE OUTPUTS |
59342 | SN54ABT843JT | 9-BIT BUS-INTERFACE D-TYPE LATCHES WITH 3-STATE OUTPUTS |
59343 | SN54ABT843W | 9-BIT BUS-INTERFACE D-TYPE LATCHES WITH 3-STATE OUTPUTS |
59344 | SN54ABT853 | 8-Bit To 9-Bit Parity Bus Transceivers |
59345 | SN54ABT853FK | 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS |
59346 | SN54ABT853JT | 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS |
59347 | SN54ABT853W | 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS |
59348 | SN54ABT8543 | Scan Test Devices With Octal Registered Bus Tranceivers |
59349 | SN54ABT8543FK | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
59350 | SN54ABT8543JT | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
59351 | SN54ABT861 | 10-BIT TRANSCEIVERS WITH 3-STATE OUTPUTS |
59352 | SN54ABT861FK | 10-BIT TRANSCEIVERS WITH 3-STATE OUTPUTS |
59353 | SN54ABT861JT | 10-BIT TRANSCEIVERS WITH 3-STATE OUTPUTS |
59354 | SN54ABT863 | 9-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
59355 | SN54ABT863FK | 9-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
59356 | SN54ABT863JT | 9-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
59357 | SN54ABT8646 | Scan Test Devices With Octal Bus Transceivers And Registers |
59358 | SN54ABT8646FK | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
59359 | SN54ABT8646JT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
59360 | SN54ABT8652 | Scan Test Devices With Octal Bus Transceivers And Registers |
59361 | SN54ABT8652FK | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
59362 | SN54ABT8652JT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
59363 | SN54ABT8952 | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
59364 | SN54ABT8952FK | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
59365 | SN54ABT8952JT | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
59366 | SN54ABT8996 | 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
59367 | SN54ABT8996FK | 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
59368 | SN54ABT8996JT | 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 |
59369 | SN54ABT8996W | 10-Bit Addressable Scan Ports Multidrop-Addressable IEEE 1149.1 24-CFP |
59370 | SN54ABTE16245 | 16-Bit Incident-Wave Switching Bus Transceivers With 3-State Outputs |
59371 | SN54ABTE16245WD | 16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
59372 | SN54ABTE16246 | 11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS |
59373 | SN54ABTE16246WD | 11-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE AND OPEN-COLLECTOR OUTPUTS |
59374 | SN54ABTH162245 | 16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
59375 | SN54ABTH162245WD | 16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
59376 | SN54ABTH162260 | 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH SERIES-DAMPING RESISTORS AND 3-STATE OUTPUTS |
59377 | SN54ABTH162260WD | 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH SERIES-DAMPING RESISTORS AND 3-STATE OUTPUTS |
59378 | SN54ABTH16244 | 16-Bit Buffers/Drivers With 3-State Outputs |
59379 | SN54ABTH16244WD | 16-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
59380 | SN54ABTH16245 | 16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
59381 | SN54ABTH16245WD | 16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
59382 | SN54ABTH162460 | 4-TO-1 MULTIPLEXED/DEMULTIPLEXED REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS |
59383 | SN54ABTH162460WD | 4-TO-1 MULTIPLEXED/DEMULTIPLEXED REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS |
59384 | SN54ABTH16460 | 4-TO-1 MULTIPLEXED/DEMULTIPLEXED TRANSCEIVERS WITH 3-STATE OUTPUTS |
59385 | SN54ABTH16460WD | 4-TO-1 MULTIPLEXED/DEMULTIPLEXED TRANSCEIVERS WITH 3-STATE OUTPUTS |
59386 | SN54ABTH16823 | 18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS |
59387 | SN54ABTH16823WD | 18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS |
59388 | SN54ABTH182502A | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
59389 | SN54ABTH182502AHV | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
59390 | SN54ABTH182504A | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
59391 | SN54ABTH182504AHV | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
59392 | SN54ABTH182646A | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
59393 | SN54ABTH182646AHV | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
59394 | SN54ABTH182652A | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
59395 | SN54ABTH182652AHV | SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS AND REGISTERS |
59396 | SN54ABTH18502A | Scan Test Devices With 18-Bit Universal Bus Transceivers |
59397 | SN54ABTH18502AHV | SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS |
59398 | SN54ABTH18504A | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
59399 | SN54ABTH18504AHV | SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
59400 | SN54ABTH18646A | Scan Test Devices With 18-Bit Transceivers And Registers |
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